GSO IEC 62374:2014
IEC 62374:2007
Gulf Standard
Current Edition
·
Approved on
25 December 2014
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
GSO IEC 62374:2014 Files
English
43 Pages
Current Edition
Reference Language
Obtaining this standard through the store is currently unavailable. You can acquire it directly from its source.
GSO IEC 62374:2014 Scope
This International Standard provides a test method of Time Dependent Dielectric Breakdown
(TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation
method of TDDB failure.
Best Sellers From Electrical Sector
YSMO GSO 2530:2023
GSO 2530:2016
Yemeni Technical Regulation
Energy Labelling And Minimum Energy Performance Requirements For Air-Conditioners
GSO 2530:2016
Gulf Standard
Energy Labelling And Minimum Energy Performance Requirements For Air-Conditioners
GSO 34:2007
Gulf Technical Regulation
LEAD-ACID STARTER BATTERIES USED FOR
MOTOR VEHICLES AND INTERNAL
COMBUSTION ENGINES
GSO 35:2007
Gulf Standard
Methods of test
for lead-acid starter batteries used for motor vehicles
and internal combustion engines
Recently Published from Electrical Sector
GSO IEC 60335-2-43:2025
IEC 60335-2-43:2024
Gulf Standard
Household and similar electrical appliances - Safety - Part 2-43: Particular requirements for clothes dryers and towel rails
GSO IEC 61316:2025
IEC 61316:2021
Gulf Standard
Industrial cable reels
GSO IEC TS 63336:2025
IEC TS 63336:2024
Gulf Standard
Commissioning of VSC HVDC systems
GSO IEC TS 61400-31:2025
IEC TS 61400-31:2023
Gulf Standard
Wind energy generation systems - Part 31: Siting risk assessment